Digital analog converter for the extraction of test signals from mixed integrated circuits
Artículo de revista
Springer International Publishing
The construction of integrated circuits involves testing the correct operation of its internal blocks. For this, a common practice is the integration of functional blocks to stimulate the internal subsystems and extract the responses to those stimuli. In this article, the design and simulation of a circuit for the extraction of the response signals of the devices under test in analog and mixed-signal integrated circuits is presented. The extraction block is a 2-stage 5-bit segmented A/D converter, operating at a sampling frequency of 10 MHz, implemented in a 0.12 µm technological process, which can be powered with 1.5 Vdc. This proposal offers a reduction in the area consumed, by requiring fewer comparators than other similar solutions found in the literature.
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