Integrated analogical signs generator for testing mixed integrated circuits
Capítulo - Parte de Libro
2022-03-20
Springer, Cham
This paper presents the design of a functional block for testing analog and mixed-signal integrated circuits. The objective is that this functional block is embedded into an integrated circuit, IC, to generate the stimuli of the analog functional blocks. The result is a simple block with the ability to generate analog stimuli, as evidenced in the simulations carried out.
Intelligent Human Computer Interaction. IHCI 2021.
- Artículos científicos [3156]
Descripción:
Integrated analogical signs generator for testing mixed integrated circuits.pdf
Título: Integrated analogical signs generator for testing mixed integrated circuits.pdf
Tamaño: 41.50Kb
PDFLEER EN FLIP
Título: Integrated analogical signs generator for testing mixed integrated circuits.pdf
Tamaño: 41.50Kb
PDFLEER EN FLIP